Ming Hsieh Department of Electrical Engineering
University of Southern California
3740 McClintock Ave, EEB 344
Los Angeles CA 90089-2562
pedram at usc.edu
Office: (213) 740-4458
Fax: (213) 740-9803
Massoud Pedram obtained his B.S. degree in Electrical Engineering from the California Institute of Technology in 1986. Subsequently, he received M.S. and Ph.D. in Electrical Engineering and Computer Sciences from the University of California, Berkeley in 1989 and 1991, respectively. In September 1991, he joined the Ming Hsieh Department of Electrical Engineering of the University of Southern California where he currently is the Stephen and Etta Varra Professor in the USC Viterbi School of Engineering. Dr. Pedram is a recipient of the National Science Foundation's Young Investigator Award (1994) and the Presidential Early Career Award for Scientists and Engineers (1996). His research has received a number of other awards including two Design Automation Conference Best Paper Awards, a Distinguished Paper Citation from the Int'l Conference on Computer Aided Design, three Best Paper Awards from the International Conference on Computer Design, an IEEE Transactions on VLSI Systems Best Paper Award, and an IEEE Circuits and Systems Society Guillemin-Cauer Award.
Dr. Pedram's expertise and research interests include (click here for more):
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Y. Wang, X. Lin, N. Chang, and M. Pedram. “Joint Automatic Control of the Powertrain and Auxiliary Systems to Enhance the Electromobility in Hybrid Electric Vehicles,” To appear in Proc. of Design Automation Conf., Jun. 2015.
T. Cui, S. Chen, Y. Wang, Q. Zhu, S. Nazarian and M. Pedram. “Optimal Control of PEVs for Energy Cost Minimization and Frequency Regulation in the Smart Grid Accounting for Battery State-of-Health Degradation,” To appear in Proc. of Design Automation Conf., Jun. 2015.
T. Cui, Y. Wang, S. Nazarian, and M. Pedram. “Layout Characterization and Power Density Analysis for Shorted-Gate and Independent-Gate 7nm FinFET Standard Cells,” To appear in Proc. of ACM Great Lakes Symp. on VLSI, May 2015.
A. Shafaie, Y. Wang, P. Bogdan, and M. Pedram. “Prediction of the Dark Silicon Phenomenon under Deeply-Scaled FinFET Technologies,” To appear in Proc. of ACM Great Lakes Symp. on VLSI, May 2015.